Industry · Semiconductor industry
Industrial computer vision: automatic detection of microscopic defects
The initial problem
Microscopic defects, inspections that do not scale, fragmented technical information, and slow answers to specialized questions in high-precision environments.
The previous process
Quality inspection depended on manual review, and technical knowledge was scattered across manuals, PDFs, and presentations that only a few experts knew well.
The solution we implemented
Computer vision for anomaly classification with advanced visual analysis models and a detection pipeline, plus a RAG platform on Google Cloud to query technical documentation, PDFs, PPTX files, and manuals in natural language.
Integrated systems
- Computer vision
- Google Cloud
- RAG
- Technical documentation (PDF/PPTX)
The result
Better early detection, fewer unidentified errors, quality traceability, and fast access to knowledge without depending on a handful of experts.
Book a free audit of your current processes
Tell us which process is costing you time and we will send back a free, concrete diagnostic: what to automate, how, and what return to expect. You can also request a free demo of our products.